Structural and surface energy analysis of nitrogenated ta-C films

Rahman, MD Anisur, Soin, Navneet ORCID: 0000-0002-0196-2071, Maguire, P, D'Sa, R.A, Roy, S.S, Mahony, C.M.O, Lemoine, P, McCann, R, Mitra, S.K and McLaughlin, J.A.D (2011) Structural and surface energy analysis of nitrogenated ta-C films. Thin Solid Films, 520 (1). pp. 294-301. ISSN 0040-6090

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Abstract

Surface and bulk properties of the Filtered Cathodic Vacuum Arc prepared nitrogenated tetrahedral amorphous carbon (ta-C:N) films were characterized by X-ray Photoelectron Spectroscopy (XPS), Time of Flight Secondary Ion Mass Spectroscopy (ToF-SIMS), Raman spectroscopy, Atomic Force microscopy and contact angle techniques. An increase in the Nitrogen (N) content of the films is accompanied by a reduction in the sp3 fraction, confirmed via the deconvolution of the C 1 s XPS spectra. Critical Raman parameters such as peak position and peak width of the G band, defect ratio, ID/IG and skewness of the G line were analyzed as a function of N content. ToF-SIMS showed the variance of chemical composition with the increase in the sputtering depth. While some amount of incorporated oxygen and hydrogen were observed for all films; for high N content ta-C:N films signature of CN bonds was evident. Surface energies (both polar and dispersive components) for these ta-C:N films were analyzed in a geometric mean approach. Contact angle measurements using both deionized water and ethylene glycol reveal that upon the insertion of nitrogen into ta-C films, the initial change in the contact angle is sharp, followed by a gradual decrease with subsequent increase in N content. The variation of contact angle with increasing N content corresponds to an increase of the total surface energy with an increase of the polar component and a decrease of the dispersive component.

Item Type:	Article
Uncontrolled Keywords:	Tetrahedral amorphous carbon (ta-C), Thin films, Surface energy, Time-of-Flight Secondary Ion Mass Spectroscopy, Surface roughness, Vacuum arc deposition
Subjects:	Q Science > QC Physics
Divisions:	University of Bolton Research Centres > Institute for Materials Research and Innovation
Depositing User:	Dr Navneet Soin
Date Deposited:	28 Mar 2018 13:21
Last Modified:	28 Mar 2018 13:21
Identification Number:	10.1016/j.tsf.2011.06.031
URI:	http://ubir.bolton.ac.uk/id/eprint/1491

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